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1 article(s) from Altman, Eric I

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Mehmet Z. Baykara,
Omur E. Dagdeviren,
Todd C. Schwendemann,
Harry Mönig,
Eric I. Altman and
Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

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Figure 1: Schematic drawings illustrating data-acquisition procedures employed to record the atomic-scale sur...

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Figure 2: Isometric (a) and top (b) views of a piezoelectric scan tube employed as a precise positioning tool...

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Figure 3: Schematic drawing describing the elastic deformation/bending of an asymmetric tip apex as the tip–s...

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Figure 4: Planar three-layer tip apex models used in the analytical simulations, featuring close-packed atoms...

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Figure 5: Illustrations of the model surfaces investigated in this section. (a) The Cu(001) surface in FCC co...

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Figure 6: Simulated 2-D force fields over a Cu(001) surface along the [100] direction probed by symmetric (a:...

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Figure 7: Simulated 2-D force fields over the NaCl(001) surface along the [110] direction probed by a symmetr...

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Figure 8: 2-D force fields over the NaCl(001) surface simulated using parameters identical to the correspondi...

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Published 11 Sep 2012

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